Thermal cycling: Single chamber climatic oven.
Test conditions: 10°C/minute ramp rate between 150°C et -40°C.
Thermal shocks: Dual chamber climatic oven.
Test conditions: between 170°C et -65°C.
Accelerated stress test with fast transitions between the hot and cold chambers.
HAST (Highly Accelerated Stress Test) :
Test conditions: temperature between 110°C et 135°C with a humidity rate bewteen
50% et 85%.Highly accelerated stress test under humidity and pressure typically applied
on biased components.
Dry heat:
Test conditions: temperature between 20°C et 97°C a humidity rate between 30% et 90%.
Accelerated stress test under humidity and bias.
Damp heat :
Test conditions: temperature between 20°C et 97°C a humidity rate between 30% et 90%.
For reliability and qualification test programs, the equipment can be used in conjunction with various test benches:
• Continuous electrical monitoring:
Monitoring of the electrical resistance of component assemblies during accelerated ageing tests with ANATECH test benches and according to the IPC-9701 standard.
Test conditions:
Record of opens >200ns on 256 channels per test bench (we dispose of 5 ANATECH test benches). Static electrical measurements before and after tests in order to check for possible drifts of the resistance values of tested assemblies.
• Tests SIR (Surface Insulation Resistance):
Electrical monitoring of the insulation resistance of comb patterns or component assemblies under 85°C/85%HR temperature/humidity to evaluate the compatibility of materials/processes like solder paste/cleaning process, solder paste/solder mask …
Test conditions:
Measurements sampled every 20 minutes with a 256-channel test bench internally developped by CERB. Validation of the results after completion of the tests.
• Development of specific test benches adapted to customer needs :
- Detection of nano opens on connectors during vibration tests
- ON/OFF power cycling test bench for electronic components.