SEM enables very high magnification observations (>100000) of materials and electrically conductive components. Non electrically conductive or insulators shall be Au-Pd or carbon plated to be analyzed.
The EDS probe provides a qualitative indication of the different elements constitutive of a sample as well as a semi-quantitative analysis, from the βe. Thanks to the X mapping functionality, it also enables to obtain a visual distribution of these elements within the analyzed sample.
SEM and EDS ANALYSIS:
To better meet our customer needs and face the increasing trends towards electronic component miniaturization, the CERB company invested in a Scanning Electron Microscope (SEM) from HITACHI coupled to an EDS probe.
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