The advantages of this kind of equipment are:
- Non-destructive analysis
- Fast and accurate observation of the integrity of an integrated circuit or its assembly on PCB, a subset, the stack of the layers of a PCB …
- 3 linear movement axes (X, Y, Z)
- Picture resolution: 1µm.
- Analysis area: 406X406 mm.
- Weight of the sample to be observed up to 5 kg.
In order to refine our analysis and to better meet the requirements of our customers, the CERB Company is equipped with an X-Ray inspection system: X-TEK REVOLUTION
X-Ray inspection:
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